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Materials integrity in microsystems: a framework for a petascale predictive-science-based multiscale modeling and simulation system
Journal article   Peer reviewed

Materials integrity in microsystems: a framework for a petascale predictive-science-based multiscale modeling and simulation system

Albert C. To, Wing Kam Liu, Gregory B. Olson, Ted Belytschko, Wei Chen, Mark S. Shephard, Yip-Wah Chung, Roger Ghanem, Peter W. Voorhees, David N. Seidman, …
Computational mechanics, Vol.42(4), pp.485-510
01/09/2008

Abstract

Mathematics Mathematics, Interdisciplinary Applications Mechanics Physical Sciences Science & Technology Technology

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