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Maximizing minority accuracy for imbalanced pattern classification problems using cost-sensitive Localized Generalization Error Model
Journal article   Peer reviewed

Maximizing minority accuracy for imbalanced pattern classification problems using cost-sensitive Localized Generalization Error Model

Wing W.Y. Ng, Zhengxi Liu, Jianjun Zhang and Witold Pedrycz
Applied soft computing, Vol.104, p.107178
06/2021

Abstract

Cost-sensitive Localized generalization error model (L-GEM) Multilayer perceptron neural network (MLPNN)

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