Abstract
The tolerances of very thin, possibly conductive dielectric coating material parameters measured using the wideband free space transmission loss measurement technique in a high noise environment was investigated. The advanced postprocessing algorithm that improves those tolerances has been developed. This algorithm allows extracting thin coating material parameters with practically acceptable accuracy even when the level of systematic and random measurement noise is much greater than the level of transmission loss and insertion phase delay characteristics of the tested material sample. (c) 2013 Wiley Periodicals, Inc. Int J RF and Microwave CAE, 2013.