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Mechanical and ellipsometry measurements of thin TiN layer prepared by PIII
Journal article   Peer reviewed

Mechanical and ellipsometry measurements of thin TiN layer prepared by PIII

A. M. Abd El-Rahman, M. Raaif, S. H. Mohamed and A. Kolitsch
Materials chemistry and physics, Vol.132(1), pp.91-95
16/01/2012

Abstract

Materials Science Materials Science, Multidisciplinary Science & Technology Technology

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