Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga+, In+) and Fullerene Projectiles

Journal article

Peer reviewed

A. Delcorte, S. Yunus, N. Wehbe, N. Nieuwjaer, C. Poleunis, A. Felten, L. Houssiau, J.-J. Pireaux and P. Bertrand

Analytical chemistry (Washington), Vol.79(10), pp.3673-3689

15/05/2007

PMID: 17417819

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Title: Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga+, In+) and Fullerene Projectiles
Creators - without role: A. Delcorte - UCLouvain
S. Yunus - UCLouvain
N. Wehbe - UCLouvain
N. Nieuwjaer - UCLouvain
C. Poleunis - UCLouvain
A. Felten - UCLouvain
L. Houssiau - UCLouvain
J.-J. Pireaux - UCLouvain
P. Bertrand - UCLouvain
Publication Details: Analytical chemistry (Washington), Vol.79(10), pp.3673-3689
Publisher: American Chemical Society
Identifiers: 9945909308331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Journal article