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Microstructural and electrical properties evaluation of lead doped tin sulfide thin films
Journal article   Peer reviewed

Microstructural and electrical properties evaluation of lead doped tin sulfide thin films

S. Sebastian, Kulandaisamy, S. Valanarasu, I. S. Yahia, Hyun-Seok Kim and Dhanasekaran Vikraman
Journal of sol-gel science and technology, Vol.93(1), pp.52-61
01/01/2020

Abstract

Materials Science Materials Science, Ceramics Science & Technology Technology

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