Sign in
Microstructural, structural and dielectric analysis of Ni-doped CaCu3Ti4O12 ceramic with low dielectric loss
Journal article   Peer reviewed

Microstructural, structural and dielectric analysis of Ni-doped CaCu3Ti4O12 ceramic with low dielectric loss

F. Gaâbel, M. Khlifi, N. Hamdaoui, L. Beji, K. Taibi and J. Dhahri
Journal of materials science. Materials in electronics, Vol.30(16), pp.14823-14833
01/08/2019

Abstract

Characterization and Evaluation of Materials Chemistry and Materials Science Materials Science Optical and Electronic Materials Review

Metrics

1 Record Views

Details