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Migration enhanced epitaxy of CdSe islands on ZnSe and their optical and structural characterization
Journal article   Peer reviewed

Migration enhanced epitaxy of CdSe islands on ZnSe and their optical and structural characterization

K Leonardi, K Ohkawa, D Hommel, H Selke, F Gindele and U Woggon
Microelectronic engineering, Vol.43-44, pp.701-705
01/08/1998

Abstract

AFM II–VI semiconductors MBE Quantum dots TEM

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