Sign in
Modeling of current-voltage and capacitance-voltage characteristics of pentacene and sol-gel derived SiO2 gate dielectric layer based on thin-film transistor
Journal article   Peer reviewed

Modeling of current-voltage and capacitance-voltage characteristics of pentacene and sol-gel derived SiO2 gate dielectric layer based on thin-film transistor

S. Mansouri, L. El Mir, Ahmed A. Al-Ghamdi, Farid El-Tantawy and F. Yakuphanoglu
Synthetic metals, Vol.199, pp.159-168
01/01/2015

Abstract

Materials Science Materials Science, Multidisciplinary Physical Sciences Physics Physics, Condensed Matter Polymer Science Science & Technology Technology

Metrics

1 Record Views

Details