Abstract
Normal ultrasonic transducers of 0.5, 1, and 2 MHz are modified using delay lines which are made of Quartz. Such modification is to ameliorate the capability of the transducer to investigate Gd-doped ZnO thin films whose thickness is too thin. The normal transducers cannot test materials that have too thin thickness due to the near fields of these transducers. The near field is considered as blind area of the transducer. Therefore, the specimen under test must have thickness bigger than the near field of the used transducer, or instead delay lines can be used. Samples of Gd-doped ZnO thin films are prepared using sol gel technique. The ultrasonic pulse echo method is used at room temperature. Flaws are found in different prepared specimens. Results show that such delay lines are suitable to ameliorate the ultrasonic transducer to test Gd-doped ZnO thin films.