Sign in
Molecular Electronics at Metal/Semiconductor Junctions. Si Inversion by Sub-Nanometer Molecular Films
Journal article   Peer reviewed

Molecular Electronics at Metal/Semiconductor Junctions. Si Inversion by Sub-Nanometer Molecular Films

Omer Yaffe, Luc Scheres, Sreenivasa Reddy Puniredd, Nir Stein, Ariel Biller, Rotem Har Lavan, Hagay Shpaisman, Han Zuilhof, Hossam Haick, David Cahen, …
Nano letters, Vol.9(6), pp.2390-2394
10/06/2009
PMID: 19438192

Abstract

Chemistry Chemistry, Multidisciplinary Chemistry, Physical Materials Science Materials Science, Multidisciplinary Nanoscience & Nanotechnology Physical Sciences Physics Physics, Applied Physics, Condensed Matter Science & Technology Science & Technology - Other Topics Technology

Metrics

1 Record Views

Details