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Molecular beam epitaxial growth and characterizations of Co–Mn–Ge Heusler thin films
Journal article   Peer reviewed

Molecular beam epitaxial growth and characterizations of Co–Mn–Ge Heusler thin films

C.H. Sim, V. Ko, K.L. Teo, Z.B. Guo, T. Liew and T.C. Chong
Journal of crystal growth, Vol.308(2), pp.392-397
15/10/2007

Abstract

A1. Reflection high-energy electron diffraction A3. Molecular beam epitaxy B1. Heusler alloy B3. Spintronics

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