Abstract
Inspection and control of products' quality is a need of the day using effective and emerging methods of technology. In many cases of well-organized production processes, only the extreme values of key-processing variables are meaningful to inspect and analyze. In this article, a control chart for largest extreme observations has been proposed using Frechet distribution based on weighted variance method. The proposed chart has been compared with existing control charts available in this scenario through average run length and percentage decrease in average run length. Further, proposed chart has been applied to the data of time to failure in microcircuits describe the commercial applicability of the study. The proposed chart has dominated the existing charts in identifying process deterioration.