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Morphological impact of zinc oxide layers on the device performance in thin-film transistors
Journal article   Peer reviewed

Morphological impact of zinc oxide layers on the device performance in thin-film transistors

Hendrik Faber, Martin Klaumuenzer, Michael Voigt, Diana Galli, Benito F. Vieweg, Wolfgang Peukert, Erdmann Spiecker and Marcus Halik
Nanoscale, Vol.3(3), pp.897-899
03/2011
PMID: 21116548

Abstract

Chemistry Chemistry, Multidisciplinary Materials Science Materials Science, Multidisciplinary Nanoscience & Nanotechnology Physical Sciences Physics Physics, Applied Science & Technology Science & Technology - Other Topics Technology

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