Sign in
Multiplane-induced widening of stacking faults in fcc metals
Journal article   Peer reviewed

Multiplane-induced widening of stacking faults in fcc metals

Mutasem A. Shehadeh, G. Lu, Z. Chen, N. Kioussis and N. M. Ghoniem
Applied physics letters, Vol.91(17), pp.171905-171905-3
22/10/2007

Abstract

Physical Sciences Physics Physics, Applied Science & Technology

Metrics

1 Record Views

Details