Nanoanalysis by a high-resolution energy filtering transmission electron microscope

Journal article

Peer reviewed

Masanori Mitome, Yoshio Bando, Dmitri Golberg, Keiji Kurashima, Yoshihiro Okura, Toshikatsu Kaneyama, Mikio Naruse and Yoshiaki Honda

Microscopy research and technique, Vol.63(3), pp.140-148

15/02/2004

PMID: 14755600

Abstract

electron energy loss spectroscopy

elemental analysis

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Title: Nanoanalysis by a high-resolution energy filtering transmission electron microscope
Creators - without role: Masanori Mitome - National Institute for Materials Science
Yoshio Bando - National Institute for Materials Science
Dmitri Golberg - National Institute for Materials Science
Keiji Kurashima - National Institute for Materials Science
Yoshihiro Okura - JEOL
Toshikatsu Kaneyama - JEOL
Mikio Naruse - JEOL
Yoshiaki Honda - Sumitomo Chemical Co., Ltd., Tsukuba Research Laboratory, Ibaraki 300-3294, Japan
Publication Details: Microscopy research and technique, Vol.63(3), pp.140-148
Publisher: Wiley Subscription Services, Inc., A Wiley Company
Number of pages: 9
Identifiers: 9946980208331
Academic Unit: King Saud University
Language: English
Resource Type: Journal article