Abstract
The atomic force microscope (AFM) has become a popular tool for characterizing surfaces of different types of materials. In this paper a new technology of AFM-SPM lithography was used to conduct nanoscale scratch and indentation tests on a short carbon fiber reinforced PEEK/PTFE composite blend. In the scratch test, by moving the tip across the surface at constant velocity and fixed applied force, grooves with nanometer scale dimensions were fabricated on the PEEK matrix surfaces. The grooves consisted of a central trough with pile-ups on each side. These grooves provided information about deformation mechanisms and scratch resistance of the individual phases. In the nanoscale indentation and scratch of the polymeric phases, microploughing and microcutting are the dominant wear mechanisms. The harder phases, i.e., graphite and carbon fibers, get worn by microcracking events.[PUBLICATION ABSTRACT]