Sign in
Nanoscale compositional analysis of wurtzite BAlN thin film using atom probe tomography
Journal article   Peer reviewed

Nanoscale compositional analysis of wurtzite BAlN thin film using atom probe tomography

Jith Sarker, Tinh Binh Tran, Feras AlQatari, Che-Hao Liao, Xiaohang Li and Baishakhi Mazumder
Applied physics letters, Vol.117(23), p.232103
07/12/2020

Abstract

Physical Sciences Physics Physics, Applied Science & Technology

Metrics

1 Record Views

Details