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New Methodology for Complete Properties Extraction from Simulation Traces Guided with Static Analysis
Journal article   Peer reviewed

New Methodology for Complete Properties Extraction from Simulation Traces Guided with Static Analysis

Mohamed Hanafy, Hazem Said and Ayman M. Wahba
Journal of electronic testing, Vol.32(6), pp.705-719
01/12/2016

Abstract

Engineering Engineering, Electrical & Electronic Science & Technology Technology

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