Abstract
This study concentrated on the attenuation characteristics of the set of Cu2SnZnS4, Cu2SnZnSe4, and Cu2SnZnTe4 semiconductor compounds at various photon energies using Phy-X/PSD and Phy-X/ZeXTRa software. The estimated interaction parameters (MAC, LAC, HVL, TVL, MFP, ACS, ECS, Z(eff), N-eff, C-eff, Z(eq), R, EBF, and EABF) were plotted as a function of gamma energy ranged from 0.015 to 15 MeV for the selected compounds. The shielding properties of the interactions between the tested compounds and the proton, alpha, carbon, electron, and photon radiations were studied in detail. Cu2SnZnTe4 sample has a higher MAC, LAC, ACS, ECS, Z(eff), C-eff, and Z(eq) values. In contrast, Cu2SnZnS4 has the lowest of such parameters. Based on Phy-X/ZeXTRa software, the effective atomic number Z(eff) for the total alpha, carbon ion, proton, and electron interactions was evaluated to reach the maxima for Te- containing compound and the minima for the S-containing compound. The obtained data from Phy-X/PSD software confirmed that Cu2SnZnSe4 is the best compound for neutron shielding applications. Thus, even when gamma-ray exposure is possible, these semiconductors, specially Cu2SnZnTe4, can be safely used as an international alternative to different radiation devices, sensors, and medical applications.