Novel technique for estimating metal semiconductor field effect transitor parasitics

Journal article

Peer reviewed

Yaser A. Khalaf and Sedki M. Riad

International journal of RF and microwave computer-aided engineering, Vol.13(1), pp.62-73

01/2003

Abstract

characterization

extrinsic parasitics

MES field effect transistor

modeling

optimization

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Title: Novel technique for estimating metal semiconductor field effect transitor parasitics
Creators - without role: Yaser A. Khalaf - Time Domain
Sedki M. Riad - Time Domain
Publication Details: International journal of RF and microwave computer-aided engineering, Vol.13(1), pp.62-73
Publisher: Wiley Subscription Services, Inc., A Wiley Company
Number of pages: 12
Identifiers: 9913177008331
Academic Unit: Al Jouf University
Language: English
Resource Type: Journal article