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Observation of Meyer–Neldel rule in CdS thin films
Journal article   Peer reviewed

Observation of Meyer–Neldel rule in CdS thin films

S. Hariech, M.S. Aida and H. Moualkia
Materials science in semiconductor processing, Vol.15(2), pp.181-186
01/04/2012

Abstract

Chemical bath II–VI semiconductors Meyer–Neldel rule Polaron

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