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On dot and out of dot electrical characteristics of silicon oxide nanodots patterned by scanning probe lithography
Journal article   Peer reviewed

On dot and out of dot electrical characteristics of silicon oxide nanodots patterned by scanning probe lithography

Sabar D. Hutagalung and Teguh Darsono
Physica status solidi. C, Vol.6(4), pp.817-820
04/2009

Abstract

07.79.−v 68.37.Ps 73.63.Kv 81.16.Nd 81.16.Pr

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