Abstract
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► Oxynitrides electronic structure is provided using FP-(L)APW+lo method. ► The present calculation shows a good agreement with experiments and theoretical data. ► PW-PP and DFPT methods are employed to calculate the elastic properties and phonons. ► Si
2N
2O and Ge
2N
2O compounds are mechanically and dynamically stables. ► Elastic constants are reporte, the thermodynamic properties are deduced from phonons.
Electronic structure, bonding and optical properties of the orthorhombic oxynitrides Si
2N
2O and Ge
2N
2O are studied using the density function theory as implemented in pseudo-potential plane wave and full-potential (linearized) augmented plane wave plus local orbitals methods. Generalized gradient approximation is employed in order to determine the band gap energy. Indeed, the Si
2N
2O exhibits a large direct gap whereas Ge
2N
2O have an indirect one. Bonding is analyzed via the charge densities and Mulliken population, where the role of oxygen is investigated. The analysis of the elastic constants show the mechanical stability of both oxynitrides. Their bulk and shear modulus are slightly smaller than those reported on nitrides semiconductors due to the oxygen presence. The optical properties, namely the dielectric function, optical reflectivity, refractive index and electron energy loss, are reported for radiation up to 30
eV. The phonon dispersion relation, zone-center optical mode frequency, density of phonon states are calculated using the density functional perturbed theory. Thermodynamic properties of Si
2N
2O and Ge
2N
2O, such as heat capacity and Debye temperature, are given for reference. Our study suggests that Si
2N
2O and Ge
2N
2O could be a promising potential materials for applications in the microelectronics and optoelectronics areas of research.