Abstract
Free volume changes of amorphous Pd42.5Cu30Ni7.5P20 due to structural relaxation under isochronal heat treatments have been quantified using in situ synchrotron X-ray diffraction measurements. The analysis of the first diffraction peak position during the annealing process has allowed us to follow the free volume change during relaxation. The data obtained were successfully fitted to relaxation equations based on free volume model (FVM) and the drawn conclusion is that the FVM remain a useful tool for describing the relaxation phenomena in metallic glasses well below glass transition. The effect of deformation and temperature on kinetics of structural relaxation of the amorphous structure has been quantitatively investigated.