On the impact of process variations for carbon nanotube bundles for VLSI interconnect

Journal article

Peer reviewed

Arthur Nieuwoudt and Yehia Massoud

IEEE transactions on electron devices, Vol.54(3), pp.446-455

01/03/2007

Abstract

Applied sciences

Design. Technologies. Operation analysis. Testing

Electric, optical and optoelectronic circuits

Electronics

Exact sciences and technology

Integrated circuits

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Theoretical study. Circuits analysis and design

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Title: On the impact of process variations for carbon nanotube bundles for VLSI interconnect
Creators - without role: Arthur Nieuwoudt - Rice University
Yehia Massoud - Rice University
Publication Details: IEEE transactions on electron devices, Vol.54(3), pp.446-455
Publisher: Institute of Electrical and Electronics Engineers
Identifiers: 9945583808331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Journal article