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Optical Parameters of Both As2S3 and As2Se3 Thin Films from Ultraviolet to the Near-Infrared via Variable-Angle Spectroscopic Ellipsometer
Journal article   Peer reviewed

Optical Parameters of Both As2S3 and As2Se3 Thin Films from Ultraviolet to the Near-Infrared via Variable-Angle Spectroscopic Ellipsometer

F. Abdel-Wahab, I. M. Ashraf and F. B. M. Ahmed
Semiconductors (Woodbury, N.Y.), Vol.54(11), pp.1430-1438
01/11/2020

Abstract

Physical Sciences Physics Physics, Condensed Matter Science & Technology

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