Abstract
Thin films of phenol red are prepared using thermal evaporation technique. X-ray diffraction patterns of the powder form, as-deposited and annealed thin films are examined. The crystal structure and Miller indices of phenol red are deduced. Optical properties of phenol red thin films are investigated using spectrophotometric measurements for transmittance and reflectance as a function of wavelength in the range of 200–2500 nm. The optical constants, optical transitions, dispersion parameters and third-order nonlinear susceptibility are determined for phenol red thin films. The influence of the annealing on as-deposited films at 373 for 2 h is investigated for both of structural and optical properties.