Abstract
Designing of appropriate thin film is important for controlling the absorbance, reflection and transmission of specific wavelength of electromagnetic radiation and which will ultimately enhance the optoelectronic properties. This paper presents optical analysis of ZnO thin films using transmission spectra derived by Sellmeier model upon different thickness. For that a famous computing language "MATLAB" was employed to generate transmission data. The transmittance profile of ZnO/glass films was examined for diverse thicknesses (600 nm, 700 nm, 800 nm). Further, the different parameters such as index of refraction, coefficient of extinction, band gap and constant of dielectric were calculated by different formulas with respect to wavelength in the UV-visible region under different thickness. It is also found that the thickness-based interference on transmission and reflectance characteristics were altered by film thickness. This sort of research work will help us to find out the suitable thin film thickness coating for designing micro/nano optoelectronic devices.