Abstract
The effect of annealing temperatures on the optical properties of peiylene-66 (Dye content 40%) thin films has been reported. The optical constants (refractive index, n, and absorption index, k) of the as-deposited and annealed films have been obtained in the wavelength range 200-2500 nm by using spectrophotometric measurements at nearly normal incidence. The obtained optical constants were used to estimate the type of transition for the as-deposited and annealed films. The single oscillator model and Drude model of free carriers' absorption have been used for the analysis of refractive index dispersion, in a low frequency range, before and after annealing. (C) 2012 Elsevier Ltd. All rights reserved.