Abstract
In this paper, different techniques are used for characterization the structural, thermal and optical properties of the polyethylene terephthalate (PET) substrate. The PET substrate was characterized by X-ray diffraction (XRD), energy dispersive X-ray (EDX), differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), atomic force microscopy (AFM) and UV spectrophotometer, respectively. X-ray diffraction patterns confirm the proper phase formation of the material. The high transmission in the visible range makes this PET substrate suitable and useful such as optoelectronic and other thin film applications.