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Patch and curvature specific estimation of efficient sampling scheme for complex surface inspection
Journal article   Peer reviewed

Patch and curvature specific estimation of efficient sampling scheme for complex surface inspection

Osama Abdulhameed, Syed Hammad Mian, Abdulrahman Al-Ahmari and Hisham Alkhalefah
International journal of advanced manufacturing technology, Vol.110(11-12), pp.3407-3422
01/10/2020

Abstract

Automation & Control Systems Engineering Engineering, Manufacturing Science & Technology Technology

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