Abstract
Aim: To detect pathological brain conditions early is a core procedure for patients so as to have enough time for treatment. Traditional manual detection is either cumbersome, or expensive, or time-consuming. We aim to offer a system that can automatically identify pathological brain images in this paper. Method: We propose a novel image feature, viz., Fractional Fourier Entropy (FRFE), which is based on the combination of Fractional Fourier Transform (FRFT) and Shannon entropy. Afterwards, the Welch's t-test (WTT) and Mahalanobis distance (MD) were harnessed to select distinguishing features. Finally, we introduced an advanced classifier: twin support vector machine (TSVM). Results: A 10 x K-fold stratified cross validation test showed that this proposed FRFE + WTT + TSVM yielded an accuracy of 100.00%, 100.00%, and 99.57% on datasets that contained 66, 160, and 255 brain images, respectively. Conclusions: The proposed FRFE + WTT + TSVM method is superior to 20 state-of-the-art methods.