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Photoreflectance characterization of vanadium-doped GaAs layers grown by metalorganic vapor phase epitaxy
Journal article   Peer reviewed

Photoreflectance characterization of vanadium-doped GaAs layers grown by metalorganic vapor phase epitaxy

C. Bilel, H. Fitouri, I. Zaied, A. Bchetnia, A. Rebey and B. El Jani
Materials science in semiconductor processing, Vol.31, pp.100-105
01/03/2015

Abstract

Engineering Engineering, Electrical & Electronic Materials Science Materials Science, Multidisciplinary Physical Sciences Physics Physics, Applied Physics, Condensed Matter Science & Technology Technology

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