Abstract
•Quaternary chalcogenide Ge15-xSbxSe50Te35 samples, GSSR (0 ≤ x ≤ 15) were synthesized.•Effect of replacing Ge by Sb on physical properties of GSST samples were discussed.•Relation between refractive index and electronic polarizability were investigated.•All studied parameters are strongly dependent on the Sb-content.
This work is dedicated to the deduction of many basic physical parameters of a-Ge15-xSbxSe50Te35 bulk and thin-film samples, GSST (0.0 ≤ x ≤ 15.0 at.wt.%). Besides, study the interrelationships among refractive index, molar refractivity and electronic polarizability of these film samples. Solid-state solutions of GSST compositions were prepared followed by melt-quenching method to get the glassy bulk samples. The thin-film samples of thickness 200 nm were fabricated by thermal evaporation technique. X-ray diffractograms revealed that all prepared GSST bulk and film samples are of non-crystalline nature. The ingots bulk Ge-Sb-Se-Te samples have been used to practically estimate the density. The refractive index of Ge15-xSbxSe50Te35 amorphous thin-films have been utilized to discuss the electronic polarizability, Covalence parameter and optical electronegativity. As well as, the deviation from stoichiometry, average heat of atomization, the overall mean bond energy and the glass transition temperature are also evaluated. All studied parameters are highly dependent on the Sb-ratio.