Abstract
The objective of this work is to synthesize and evaluate the physical properties of the Zirconium-Molybdate-Oxide thin films via structural, optical and electrical measurements. The films were deposited on glass substrates using a chemical spray technique. The structural properties of obtained samples were analyzed by XRD technique and hexagonal ZrMo2O8 structure was revealed in the films. The surface topography, as observed by scanning electron microscopy (SEM), shows the presence of randomly orientated spherical asperities similar to 2.5 mu m in size. In addition, the optical parameters such as band gap energy value, refractive index and extinction coefficient were studied using spectrophotometry UV-VIS-NIR and spectroscopic ellipsometry. Finally, the dependences of electrical properties of ZrMo2O8 thin film on temperature and frequency have been reported. The ac conductivity is investigated through the Jonscher model. The dc conductivity is thermally activated and the semiconductor-type behavior of the ZrMo2O8 thin films is revealed. From the relaxation frequency, the activation energy value is about 1.29 eV.