- Title
- Raman micro-spectroscopy for quantitative thickness measurement of nanometer thin polymer films
- Creators - without role
- Barbara M. Liszka - University of TwenteAufried T. M. Lenferink - University of TwenteGeert-Jan Witkamp - Delft University of TechnologyCees Otto - University of Twente
- Publication Details
- Journal of Raman spectroscopy, Vol.46(12), pp.1230-1234
- Publisher
- Blackwell Publishing Ltd
- Edition
- Liszka, B. M., Lenferink, A. T. M., Witkamp, G.-J., and Otto, C. (2015) Raman micro-spectroscopy for quantitative thickness measurement of nanometer thin polymer films. J. Raman Spectrosc., 46: 1230-1234. doi: 10.1002/jrs.4749.
- Number of pages
- 5
- Identifiers
- 9944688608331
- Academic Unit
- King Abdullah University of Science & Technology
- Language
- English
- Resource Type
- Journal article
Journal article
Raman micro-spectroscopy for quantitative thickness measurement of nanometer thin polymer films
Journal of Raman spectroscopy, Vol.46(12), pp.1230-1234
Liszka, B. M., Lenferink, A. T. M., Witkamp, G.-J., and Otto, C. (2015) Raman micro-spectroscopy for quantitative thickness measurement of nanometer thin polymer films. J. Raman Spectrosc., 46: 1230-1234. doi: 10.1002/jrs.4749.
12/2015
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