Abstract
Objective: The hypothesis of this two-part study is that adhesive systems for bonding orthodontic brackets (ie, two self-etch primers [Transbond and M-Bond] and a conventional phosphoric acid etch [Rely-a-Bond]) would show a difference with respect to rebonded enamel surface morphology and chemical composition.
Materials and Methods: This study examined the enamel surface before and after debonding with scanning electron microscopy and the enamel surface chemical composition for the elements Ca, P, O, F, Si, and C using x-ray photoelectron spectroscopy.
Results: The etching of the two self-etch groups is less aggressive and less uniform than that of phosphoric acid. The change in the concentration of C indicated that the separation of the bracket from the enamel surface is at the resin-enamel interface for the phosphoric acid-etched adhesive and a mixed mode involving the enamel-resin-bracket interfaces for the self-etching systems. F release appears to occur for Transbond but not for M-Bond.
Conclusions: The results confirm the original hypothesis that differences in adhesive systems are manifested in less aggressive etches and less adhesive left on the enamel surface for the self-etching adhesive systems.