Sign in
Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths
Journal article   Open access  Peer reviewed

Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths

P. Lv, G. F. Cao, L. J. Wen, S. Al Kharusi, G. Anton, I. J. Arnquist, I. Badhrees, P. S. Barbeau, D. Beck, V. Belov, …
IEEE transactions on nuclear science, Vol.67(12), pp.2501-2510
01/12/2020

Abstract

Diffuse reflectance Laser beams Measurement by laser beam Optical variables measurement Photodetectors photon detection efficiency (PDE) Photonics silicon photomultiplier (SiPM) specular reflectance Surface treatment vacuum ultraviolet (VUV)
url
https://doi.org/10.1109/TNS.2020.3035172View
Published (Version of record) Open

Metrics

1 Record Views

Details