Abstract
Amorphous CrxTi1-xO2 films with different Cr concentrations of 0 <= x <= 0.16 were prepared by cosputtering method at room temperature. All as-deposited samples show hysteresis behavior from 2 to 340 K and the Curie temperatures are well above 390 K. The saturation magnetization is about 3.21x10(-1)mu(B)/Cr for x=0.05 at 340 K and decreases with increasing Cr dopant. After annealing at temperature above 300 degrees C, the films crystallized into anatase structure and lost their ferromagnetic property. The results indicate that the ferromagnetism in amorphous Cr-doped TiO2 films is intrinsic and the structural defects play an important role in the ferromagnetism of Cr:TiO2 system. (c) 2006 American Institute of Physics.