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STRESS METROLOGY AND RADIO-FREQUENCIES CHARACTERISTIC OF AlGaN/GaN HIGH ELECTRON MOBILITY TRANSISTORS (HEMTs)
Journal article

STRESS METROLOGY AND RADIO-FREQUENCIES CHARACTERISTIC OF AlGaN/GaN HIGH ELECTRON MOBILITY TRANSISTORS (HEMTs)

S. Ayachi, A. Guesmi, N. Ben Hamadi, K. Khairouni, S. Althoyaib and M. Gassoumi
Journal of Ovonic Research, Vol.13(6), pp.339-343
01/11/2017

Abstract

Materials Science Materials Science, Multidisciplinary Physical Sciences Physics Physics, Applied Science & Technology Technology

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