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STRUCTURE-ENHANCED YIELD SHEAR STRESS IN ELECTRORHEOLOGICAL FLUIDS
Journal article   Peer reviewed

STRUCTURE-ENHANCED YIELD SHEAR STRESS IN ELECTRORHEOLOGICAL FLUIDS

R Tao, Y. C Lan and X Xu
International journal of modern physics. B, Condensed matter physics, statistical physics, applied physics, Vol.16(17n18), pp.2622-2628
20/07/2002

Abstract

PHYSICAL MECHANISMS

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