Sign in
Scalable Mutation Testing Using Predictive Analysis of Deep Learning Model
Journal article   Open access  Peer reviewed

Scalable Mutation Testing Using Predictive Analysis of Deep Learning Model

Muhammad Rashid Naeem, Tao Lin, Hamad Naeem, Farhan Ullah and Saqib Saeed
IEEE access, Vol.7, pp.158264-158283
01/01/2019

Abstract

Computer Science Computer Science, Information Systems Engineering Engineering, Electrical & Electronic Science & Technology Technology Telecommunications
url
https://doi.org/10.1109/ACCESS.2019.2950171View
Published (Version of record) Open

Metrics

1 Record Views

Details