Abstract
Two new types of light microscopy, scanning transmitted light and scanning reflected light microscopy (STLM and SRLM, respectively) were developed. STLM and SRLM are based on optical density recognition (ODR) of the scanned transmitted or reflected light, respectively, from the object to be visualized. The obtained image is a result of enhanced interference between the scanning and transmitted/reflected beams from the object. The new microscopy, in its initial phase, is ideally suited for monitoring macroscopic and sub-millimeter size self-assembly and for elucidating the connection between the macroscopic and nanoscopic worlds if combined with atomic force microscopy (AFM) or electron microscopy (EM). The method is demonstrated by monitoring the growth of 3D crystals from their original liquid phase. Some preliminary measurements carried out using the prototype of the new microscopy are presented and its current and future possible applications are described.