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Silicon Surface Passivation by Organic Monolayers: Minority Charge Carrier Lifetime Measurements and Kelvin Probe Investigations
Journal article   Peer reviewed

Silicon Surface Passivation by Organic Monolayers: Minority Charge Carrier Lifetime Measurements and Kelvin Probe Investigations

Alexander B. Sieval, Carolien L. Huisman, Axel Schönecker, Frank M. Schuurmans, Arvid S. H. van der Heide, Albert Goossens, Wim C. Sinke, Han Zuilhof and Ernst J. R. Sudhölter
The journal of physical chemistry. B, Vol.107(28), pp.6846-6852
17/07/2003

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