Silicon Surface Passivation by Organic Monolayers: Minority Charge Carrier Lifetime Measurements and Kelvin Probe Investigations

Alexander B. Sieval; Carolien L. Huisman; Axel Schönecker; Frank M. Schuurmans; Arvid S. H. van der Heide; Albert Goossens; Wim C. Sinke; Han Zuilhof; Ernst J. R. Sudhölter

doi:10.1021/jp034314v

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Silicon Surface Passivation by Organic Monolayers: Minority Charge Carrier Lifetime Measurements and Kelvin Probe Investigations

Journal article

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Silicon Surface Passivation by Organic Monolayers: Minority Charge Carrier Lifetime Measurements and Kelvin Probe Investigations

Alexander B. Sieval, Carolien L. Huisman, Axel Schönecker, Frank M. Schuurmans, Arvid S. H. van der Heide, Albert Goossens, Wim C. Sinke, Han Zuilhof and Ernst J. R. Sudhölter

The journal of physical chemistry. B, Vol.107(28), pp.6846-6852

17/07/2003

DOI: https://doi.org/10.1021/jp034314v

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Title: Silicon Surface Passivation by Organic Monolayers: Minority Charge Carrier Lifetime Measurements and Kelvin Probe Investigations
Creators - without role: Alexander B. Sieval - Delft University of Technology
Carolien L. Huisman - Delft University of Technology
Axel Schönecker - Delft University of Technology
Frank M. Schuurmans - Delft University of Technology
Arvid S. H. van der Heide - Delft University of Technology
Albert Goossens - Delft University of Technology
Wim C. Sinke - Delft University of Technology
Han Zuilhof - Delft University of Technology
Ernst J. R. Sudhölter - Delft University of Technology
Publication Details: The journal of physical chemistry. B, Vol.107(28), pp.6846-6852
Identifiers: 9939384208331
Academic Unit: King Abdulaziz University
Language: English
Resource Type: Journal article