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SkSP-V Sampling Plan for the Exponentiated Weibull Distribution
Journal article   Peer reviewed

SkSP-V Sampling Plan for the Exponentiated Weibull Distribution

Muhammad Aslam, G. Srinivasa Rao, Nasrullah Khan and Chi-Hyuck Jun
Journal of testing and evaluation, Vol.42(3), pp.687-694
01/05/2014

Abstract

Materials Science Materials Science, Characterization & Testing Science & Technology Technology

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