Abstract
The electrical conduction properties of DBM thin films with different thicknesses, sandwiched between gold (Au) electrodes were investigated at the temperature range 291–353 K. At the low-voltage region the current conduction in Au/DBM/Au device is ohmic type. The charge transport phenomenon appears to be space charge limited current (SCLC) at higher-voltage regions, dominated by a discrete deep trapping level having trap density of 1.31 × 10
−21 cm
−3. Various electrical parameters were determined from J–V analysis.
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