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Spectroscopic ellipsometry characterization of Ge30-xSbx Se-70 films using combinations of multiple dispersion functions
Journal article   Peer reviewed

Spectroscopic ellipsometry characterization of Ge30-xSbx Se-70 films using combinations of multiple dispersion functions

F. Abdel-Wahab, A. Badawi, M. S. Alatibi, S. E. Alomairy, N. N. Ali Karar, I. M. Ashraf and E. M. Ahmed
Optik (Stuttgart), Vol.147, pp.59-71
01/01/2017

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Optics Physical Sciences Science & Technology

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