Spectroscopic ellipsometry characterization of amorphous Se100-xTex films using the Cody–Lorentz parameterized model

Journal article

Peer reviewed

F. Abdel-Wahab, Ali Badawi, A. A. F. Al-yami and M. M. Mahasen

Applied physics. A, Materials science & processing, Vol.127(7)

01/07/2021

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Title: Spectroscopic ellipsometry characterization of amorphous Se100-xTex films using the Cody–Lorentz parameterized model
Creators - without role: F. Abdel-Wahab - Aswan University
Ali Badawi - Taif University
A. A. F. Al-yami - Taif University
M. M. Mahasen - Aswan University
Publication Details: Applied physics. A, Materials science & processing, Vol.127(7)
Identifiers: 9910513108331
Academic Unit: Taif University
Language: English
Resource Type: Journal article