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Spectroscopic ellipsometry study of TlGaSeS layered crystal
Journal article   Peer reviewed

Spectroscopic ellipsometry study of TlGaSeS layered crystal

F. Abdel-Wahab, I.M. Ashraf and A.A. Montaser
Optik (Stuttgart), Vol.178, pp.813-820
01/02/2019

Abstract

Dielectric Interband transitions Orthogonal incidence reflectivity Refractive index Variable angle spectroscopic ellipsometry

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